The T1 matrix of the device under test is found as:
\begin{equation} T_{1}=\left[\begin{matrix}0 & \frac{R_{a} R_{b}}{R_{a} + R_{b} + R_{c}}\\0 & \frac{R_{b} + R_{c}}{R_{a} + R_{b} + R_{c}}\end{matrix}\right] \end{equation}The matrix equation for the two-port (DUT) is found as:
$$\left[\begin{matrix}V_{in}\\I_{in}\end{matrix}\right]=\left[\begin{matrix}0 & \frac{R_{a} R_{b}}{R_{a} + R_{b} + R_{c}}\\0 & \frac{R_{b} + R_{c}}{R_{a} + R_{b} + R_{c}}\end{matrix}\right]\cdot\left[\begin{matrix}V_{out}\\I_{out}\end{matrix}\right]$$
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Last project update: 2023-11-25 20:52:48